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4 functions in 1 device
  • Auto Refractometer
  • Keratometer
  • Corneal Topographer
  • Aberrometer
High Level of Performance
  • Very fast and easy to use
  • High Precision
  • Fully automatic (XYZ alignment)



For more information about this product, please contact: visionix@visionix.com


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Automatic Functions


Refractometry




Corneal Topography








Total Wavefront Map


  • High precision Refractometry.
  • Central and peripheral Keratometry.
  • Topography up to 100 000 points.
  • High density Aberrometry up to 1500 points.


Wave-Front Technology


Simulation of Visual Accuity
The "Wave-Front" technology allows more precise refractometry; thus setting up a better starting point for refraction. It also allows:
  • Measurement through pupils of small diameters (2mm).
  • Measurement of potential accommodation.
  • Simulation of visual acuity.


Wave+ Advantages


  • Fully automatic 3-D and R/L eye alignments.
  • 4 types of automatic simultaneous measurements.
  • Operator independant measurements.
  • High reproducibility of measurements.


Ultra efficient 3-D alignment
Entirely automatic alignment and measurement allowing:
  • Higher reliability of measurements.
  • Significant time saving.
  • Great comfort of use.


Aberrometry applications


Point Spread Function



Keratocone Detection
  • All useful data for refractive surgery.
  • Evaluation of visual acuity in night vision.
  • Evaluation of accommodation*.
  • Evaluation of "Wave Front guided" surgery.


Corneal Topography applications
  • Higher precision in keratometry.
  • Automatic detection of keratocones.
  • Precise tool for contact lenses fitting & prescription (Contact Lens database).


Corneal Topography & Aberrometry associated together


Aberration / Pupil Diameter (Night Vision)
More comprehensive diagnostics of visual acuity:
  • Pre and post follow-up in corneal surgery.
  • Separation of refractive and corneal aberration problems.
  • Acuity simulations according to pupil diameters.


Used for the first time in refraction procedures, this technology brings



Topography / Aberration


*Certified for Windows XP

  • Higher precision of measurements.
  • Unequalled reliability of measurements.
  • Complementary analysis functions.